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  1. JTAG/Boundary Scan, IEEE 1149.1, Scantest, Automotive Test, AOI Systeme, Automatische Optische Inspektion, Digitale Bildverarbeitung, Netzwerktest - GÖPEL ...

    JTAG/Boundary Scan Testverfahren, Mess- und Prueftechnik zum Einsatz in der Automobilindustrie,Steuergerätetest,Testen und Programmieren komplexer ...
    Test3
    ATS2
    ECU1
    Komponenten1
    Inspektion1
    Baugruppen1
    Automatische1
    JTAG1
    Optische1
    national instruments1
    elektronischer1
    Boundary Scan1
    Digitale Bildverarbeitung1
    IEEE 1149.11
    Funktionstester1
    göpel1
    Automotive Test1
    Steuergerätetest1
    IEEE 1149.41
    jtag technologies1
    netzwerktest1
    AOI Systeme1
    IEEE 1149.61
    ieee 1149.x1

    www.goepel.com - 2009-02-14

  2. StarTest Home Page

    StarTest is working as the Israeli HW test company since January 2003 and have the abundant experience in the ICT and JTAG (Boundary-Scan) testing on all HW ...
    FLASH5
    ICT2
    FPGA2
    ProVision1
    DFT1
    CPLD1
    JTAG1
    onTAP1
    I2C1
    Boundary Scan1
    bsdl1
    Design For Testability1
    Boundary-Scan1
    ScanPlus1
    ScanWorks1
    CASCON1
    JTAG test1
    Design-For-Testability1
    IEEE 1149.41
    IEEE 1149.61
    IEEE15321
    IEEE 15321
    bsdl validation0
    IEEE 15000
    IEEE P16870
    StarTest0
    Start-Test0
    Teradyne Z18xx0

    www.start-test.com - 2009-04-02

  3. EP-TeQ ApS * En god forretning for alle parter

    EP-TeQ ApS supplies test instrumentation and accessories to the electronics industry. EP-TeQ ApS also supplies a range design-to-manufacturing services.
    electronics4
    ISP4
    automotive4
    endurance2
    JAM2
    Lars1
    Flash programming1
    AOI1
    JTAG1
    CAN-bus1
    optical inspection1
    Electronic Production1
    BSDL1
    Knud1
    IEEE 1149.11
    run-in1
    Boundary-Scan1
    in-system programming1
    GOEPEL1
    Göpel1
    IEEE 1149.41
    STAPL1
    Elektronik Produktion1
    IEEE 15321
    assembly-testing0
    board-testing0
    Buundary Scan0
    EP-TeQ0
    IEEE 1149.50
    Knud Vester0
    Lars Kongsted-Jensen0

    www.ep-teq.com - 2009-02-08

göpel1 embedded2 ieee 1149.11 goepel1 boundary scan1 dsp rtos1 jtag1 arm2

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